The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Nov. 12, 2010
Yuichiro Matsuo, Tokyo, JP;
Yuichiro Matsuo, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An arbitrary entire region of a specimen, or a plurality of individual regions, is simultaneously stimulated without a time lag, or a strong stimulus is applied to an arbitrary region of a specimen. The invention provides a microscope apparatus including a first stimulation optical system having a galvanometer mirror that scans a specimen with first stimulus light, which applies an optical stimulus to a specimen, on the specimen; a second stimulation optical system which has a plurality of two-dimensionally arrayed movable mirrors and which switches the angle of each movable mirror so that second stimulus light, which applies an optical stimulus to the specimen, can be selectively deflected towards the specimen; and a dichroic mirror that combines a light path of the first stimulation optical system and a light path of the second stimulation optical system.