The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8411288 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 02, 2013

Filed:

Dec. 04, 2009
Applicants:

Gunter Schneider, Marburg, DE;

Torsten Gerrath, Marburg, DE;

Klaus Krämer, Dautphetal-Friedensdorf, DE;

Inventors:

Gunter Schneider, Marburg, DE;

Torsten Gerrath, Marburg, DE;

Klaus Krämer, Dautphetal-Friedensdorf, DE;

Assignee:

Schneider GmbH & Co. KG, Fronhausen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an arrangement for determining the coordinates K of at least one point Pon an edge of an optical lens, wherein the lens is held/can be positioned, by a retaining device, with the edge which is to be measured in an optical path of an optical micrometer, whereby the lens is held/can be positioned with the edge in the optical path, a coordinate Za is determined for the point P, a variation of the relative position between the lens and the optical path is made, which is based on a pivotal axis S, a coordinate Zb is determined in the new position B for the point P, and the coordinates Ya and Yb are determined.


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