The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Jul. 30, 2009
Liang-chia Chen, Taipei County, TW;
Yao-sheng Shu, Tainan County, TW;
Liang-Chia Chen, Taipei County, TW;
Yao-Sheng Shu, Tainan County, TW;
National Taipei University of Technology, Taipei, TW;
Abstract
The present invention provides a method for simultaneous hue phase-shifting and a system for 3-D surface profilometry, wherein a single structured-light fringe pattern with encoded multiple trapezoidal color fringes is projected on an object so as to obtain a color image having deformed fringe patterns and then a hue information extracted from a HSI color model associated with the fringe pattern is transformed into a hue phase-shifting information for restructuring the 3-D surface profile of the object. Since the color structured light is composed of a plurality of colorful light having phase shifts with each other in spatial domain, the single structured-light pattern comprises multiple hue phase-shifting information so that the phase shifting and unwrapping can be performed by one-shot 3-D surface reconstruction process without needs of traditional conventional phase wrapping and Euler's transformation procedures such that the efficiency of phase shifting and 3-D surface measurement can be improved.