The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Feb. 24, 2009
Applicants:

Eleanor Rieffel, Mountain View, CA (US);

Donald Kimber, Foster City, CA (US);

Jun Shingu, San Jose, CA (US);

Chong Chen, Chicago, IL (US);

James Vaughan, Sunnyvale, CA (US);

Sagar Gattepally, Fremont, CA (US);

Inventors:

Eleanor Rieffel, Mountain View, CA (US);

Donald Kimber, Foster City, CA (US);

Jun Shingu, San Jose, CA (US);

Chong Chen, Chicago, IL (US);

James Vaughan, Sunnyvale, CA (US);

Sagar Gattepally, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 17/00 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for defining a model by analyzing images of a physical space. In some embodiments the images of a physical space contain distinctive visual features with associated semantic information, and the model is defined using image feature detection techniques to identify distinctive visual features and a rich marker-based markup language to give meaning to the distinctive visual features. In some embodiments the distinctive visual features are predefined markers, and the markup language specifies model aspects and rules for combining semantic information from a plurality of markers to define the model.


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