The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Nov. 03, 2010
Thomas Eibert, Munich, DE;
Torsten Fritzel, Munich, DE;
Carsten Schmidt, Munich, DE;
Hans-juergen Steiner, Munich, DE;
Thomas Eibert, Munich, DE;
Torsten Fritzel, Munich, DE;
Carsten Schmidt, Munich, DE;
Hans-Juergen Steiner, Munich, DE;
Astrium GmbH, Taufkirchen, DE;
Abstract
A method for measuring a radiation field in the direct vicinity of a measured object is provided. One or more antenna measurement probe(s) are moved in any desired fashion within the radiation field, and a number of high-frequency measurement points is thus recorded. During the movement of the antenna measurement probe, a position determination of a respective antenna measurement probe is conducted simultaneously with or in close temporal proximity to the capture of a respective high-frequency measurement point, in order to assign a position to each high-frequency measurement point so as to generate a spatially defined measurement point cloud. Finally, radiation patterns at any distance from the measured object may be determined from the spatial measurement point cloud by means of a field transformation method.