The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
Apr. 17, 2008
Hiroyuki Sakai, Kyoto, JP;
Takeshi Fukuda, Osaka, JP;
Takuya Sakamoto, Kyoto, JP;
Toru Sato, Kyoto, JP;
Hiroyuki Sakai, Kyoto, JP;
Takeshi Fukuda, Osaka, JP;
Takuya Sakamoto, Kyoto, JP;
Toru Sato, Kyoto, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A shape measurement instrument includes a plurality of transmitterstowhich radiate signals having different waveforms or phases, receiverstowhich receive signals reflected from an object O, correlation unitstowhich obtain correlation waveforms between waveforms of the signals received by the receiversto, and the signal radiated by a transmitter radiating the received signal of the transmittersto, and a shape estimation unitwhich extracts a quasi-wavefront based on the correlation waveforms obtained by the correlation unitstoand estimates a shape of the object O based on a relationship between the quasi-wavefront and the object O. As a result, a period of time required to measure an object shape can be significantly reduced.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile