The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Jun. 17, 2009
Applicants:

LU Wang, Los Angeles, CA (US);

Ulrich Neumann, Manhattan Beach, CA (US);

Suya You, Aracida, CA (US);

Inventors:

Lu Wang, Los Angeles, CA (US);

Ulrich Neumann, Manhattan Beach, CA (US);

Suya You, Aracida, CA (US);

Assignee:

Chevron U.S.A., Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system of matching features in a pair of images using line signatures. The method includes determining a first similarity measure between a first line signature in a first image in the pair of images and a second line signature in a second image in the pair of images; determining a second similarity measure between the first line signature in the first image and a third line signature in the second image; comparing the first similarity measure with a first threshold value; comparing a difference between the first similarity and the second similarity with a second threshold value; and if the first similarity measure is greater than the first threshold value and the difference between the first similarity and the second similarity is greater than the second threshold value, the first line signature and the second line signature produce a match.


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