The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Jan. 29, 2009
Yi MA, Champaign, IL (US);
Allen Yang Yang, Berkeley, CA (US);
John Norbert Wright, Urbana, IL (US);
Andrew William Wagner, Urbana, IL (US);
Yi Ma, Champaign, IL (US);
Allen Yang Yang, Berkeley, CA (US);
John Norbert Wright, Urbana, IL (US);
Andrew William Wagner, Urbana, IL (US);
The Regents of the University of California, Oakland, CA (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A method is disclosed for recognition of high-dimensional data in the presence of occlusion, including: receiving a target data that includes an occlusion and is of an unknown class, wherein the target data includes a known object; sampling a plurality of training data files comprising a plurality of distinct classes of the same object as that of the target data; and identifying the class of the target data through linear superposition of the sampled training data files using lminimization, wherein a linear superposition with a sparsest number of coefficients is used to identify the class of the target data.