The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Mar. 10, 2010
Methods for evaluating distances in a scene and apparatus and machine readable medium using the same
Ludovic Angot, Hsinchu, TW;
Chuan-chung Chang, Hsinchu, TW;
Po-chang Chen, Taipei, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A distance evaluation method for evaluating distances from an observation point to objects within an arbitrary detectable range in a scene is disclosed. The method includes the following steps. First, a focus distance is set to correspond to a lower or higher limit of a chosen detection range. Next, an image is then captured with an image acquisition system, wherein transfer function of the image acquisition system depends on the focus distance. The captured image of the scene is segmented. A blur metric is computed for each image segment of the captured image. The blur metric is associated with the distance of the objects from the observation point in each image segment.