The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Jan. 20, 2010
Applicants:

Amir Najari, Toronto, CA;

Kenneth Fang, Arcadia, CA (US);

William Gugg, Schomberg, CA;

Thomas Kettell, Eden Prairie, MN (US);

Inventors:

Amir Najari, Toronto, CA;

Kenneth Fang, Arcadia, CA (US);

William Gugg, Schomberg, CA;

Thomas Kettell, Eden Prairie, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Simultaneous scanning of multiple checks. In one example embodiment, a method for simultaneous scanning of multiple checks with a flatbed scanner includes several acts. First, a front side of a transparent sleeve is scanned on a flatbed scanner in order to create a first image. The sleeve has multiple pockets with a check positioned in each pocket. The sleeve further has multiple alignment markings on the front side and on a back side of the sleeve. Next, the back side of the sleeve is scanned on the flatbed scanner in order to create a second image. Then, it is determined from the respective positions of the alignment markings on the first image and on the second image that the sleeve was rotated between scans. Finally, one of the first and second images is automatically rotated to match the other image in order to align each front/back check image pair.


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