The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Jun. 20, 2007
Applicants:

Kazuaki Takahashi, Tokyo, JP;

Suguru Fujita, Tokyo, JP;

Michiaki Matsuo, San Jose, CA (US);

Yutaka Murakami, Osaka, JP;

Satoshi Hasako, Tokyo, JP;

Inventors:

Kazuaki Takahashi, Tokyo, JP;

Suguru Fujita, Tokyo, JP;

Michiaki Matsuo, San Jose, CA (US);

Yutaka Murakami, Osaka, JP;

Satoshi Hasako, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/22 (2006.01); H04L 7/00 (2006.01); H04B 7/208 (2006.01);
U.S. Cl.
CPC ...
Abstract

A code error detecting device that can more precisely detect a code error due to a delayed wave is disclosed. The code error detecting device includes a receiving antenna () for receiving a on-off keying modulated pulse and its code-reversed pulse, a pulse detector () for outputting detected data in accordance with the pulses, a code comparing unit () for comparing each code of first received data (R) with one of second received data (R), wherein the first and second received data are derived from the output detected data, and an error detecting unit () for detecting an error of each code from a comparison result (D) indicative of a result compared in the code comparing unit ().


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