The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Mar. 04, 2008
Applicants:

Jia-yang Juang, Santa Clara, CA (US);

Timothy C. Reiley, San Jose, CA (US);

Timothy C. Strand, San Jose, CA (US);

Inventors:

Jia-Yang Juang, Santa Clara, CA (US);

Timothy C. Reiley, San Jose, CA (US);

Timothy C. Strand, San Jose, CA (US);

Assignee:

HGST Netherlands B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, system, and method for measuring thermally induced electric resistance changes in thermally assisted magnetic recording are disclosed for monitoring laser light output in thermally assisted magnetic recording disk drives. An electrical lead is coupled to a read/write head element. A first electrical resistance in the read/write head element is measured. The read/write head is heated by a laser and a second electrical resistance in the read/write head element is measured. The electrical resistance may be monitored at regular intervals when the read/write head element is on the ramp or the electrical resistance measurements may be continuously monitored as the read/write head flies over the magnetic media.


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