The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Sep. 25, 2009
Fan Xia, Qiaodong, CN;
Yiqing Ren, Beijing, CN;
Shengwen Jin, Sugarland, TX (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
In at least some embodiments, the system obtains shot gathers for a survey region and migrates the shot gather data with an initial velocity model to obtain angle-domain common image gathers. The system processes the common image gathers to determine depth residuals and corresponding angle-dependent time deviations throughout a seismic survey region. The system solves a set of tomographic equations which employ ray theory to establish a relationship between a travel time deviation and the depth residual of a reflector in the depth-offset ray parameter (z,p) domain. The resulting updates are applied to the velocity model and can be used to re-migrate the shot gather data. The system generates a representation of the survey region that can be displayed to a user.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile