The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Aug. 01, 2008
Applicants:

Hiroaki Suzuki, Tsurugashima, JP;

Akio Fukushima, Katsushika, JP;

Takayuki Kasuya, Ota, JP;

Inventors:

Hiroaki Suzuki, Tsurugashima, JP;

Akio Fukushima, Katsushika, JP;

Takayuki Kasuya, Ota, JP;

Assignee:

Pioneer Corporation, Kawasaki-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

The controller includes a deflection signal generator for generating a deflection signal for causing the electron beam to deflect and perform overwriting so that a beam spot of the electron beam follows the translation of the substrate over a period during which the substrate is rotated over a predetermined number of overwriting cycles; and a data output unit for outputting the drawing data, wherein, the deflection signal generator generates a deflection adjustment signal for irradiating the electron beam at a starting position for drawing a concentric circle to be subsequently overwritten after a predetermined deflection adjustment period has elapsed since overwriting of concentric circles based on the drawing data has completed.


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