The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Feb. 29, 2008
Applicant:

Jean-christophe Olaya, Berlin, DE;

Inventor:

Jean-Christophe Olaya, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/11 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for correcting the wavelength dependence in diffraction-based optical systems in which certain orders of diffraction are filtered is disclosed, comprising at least one diffractive optical spatial light modulator that has controllable structures, and at least one light source for illuminating the spatial light modulator. Associated orders of diffraction are created which, depending on the wavelength, have a lateral chromatic offset relative to the position of the different extensions thereof on a filter plane defined by the focal length of a downstream optically focusing system, the lateral chromatic offset being in relation to the normal line to the surface of the spatial light modulator. The equinumerous orders of diffraction of different wavelengths overlap to an sufficient extent on a predefined filter plane in relation to both the direction and the extension thereof.


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