The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Sep. 26, 2008
Applicants:

David S. Gere, Palo Alto, CA (US);

Ting Chen, Sunnyvale, CA (US);

Chad Andrew Bronstein, Sunnyvale, CA (US);

Inventors:

David S. Gere, Palo Alto, CA (US);

Ting Chen, Sunnyvale, CA (US);

Chad Andrew Bronstein, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method are disclosed for calibrating image capture devices, such as the type used in electronic devices. In some embodiments, the electronic device may include at least one array of pixels and a memory coupled to the at least one array of pixels. The electronic device may further include a central processing unit (CPU) coupled to the memory and at least one color filter optically coupled to the at least one array of pixels. The memory may further include one or more storage locations that include a response of the at least one color filter to one or more predetermined wavelengths from a target test source, as well as, one or more storage locations that include a response of one or more baseline color filters.


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