The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Sep. 18, 2008
Ryuji Hamada, Osaka, JP;
Akira Kameda, Osaka, JP;
Ryuji Hamada, Osaka, JP;
Akira Kameda, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
Aims to provide an inspection apparatus and an inspection method for detecting an amount of misalignment of a component mounted on a panel through an ACF. The inspection apparatus detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a panel's top surface through an AFC, and includes: a visible light illuminator () which illuminates with visible light a panel recognition mark formed on the panel's top surface; an infrared light illuminator which is provided on a side of the component's bottom surface not adhered to the panel and illuminates with infrared light a component recognition mark formed on the component's top surface; a visible light camera () which is provided on a bottom surface side of the panel which is opposite to a side of the panel on which the component is mounted, and which captures an image of the panel recognition mark illuminated with the visible light; an infrared camera () which is provided on a side of a bottom surface of the component not adhered to the panel, and which captures an image of the component recognition mark illuminated with the infrared light; and an amount-of-misalignment calculation unit which calculates an amount of misalignment from a predetermined positional relationship between the panel recognition mark and the component recognition mark based on the captured images of the panel recognition mark and the component recognition mark.