The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8405551 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 26, 2013

Filed:

Feb. 10, 2012
Applicants:

Shohei Hido, Kanagawa-ken, JP;

Tsuyoshi Ide, Kanagawa-ken, JP;

Hisashi Kashima, Kanagawa-ken, JP;

Shoko Suzuki, Kanagawa-ken, JP;

Akira Tajima, Tokoyo-to, JP;

Rikiya Takahashi, Kanagawa-ken, JP;

Toshihiro Takahashi, Kanagawa-ken, JP;

Yuta Tsuboi, Kanagawa-ken, JP;

Inventors:

Shohei Hido, Kanagawa-ken, JP;

Tsuyoshi Ide, Kanagawa-ken, JP;

Hisashi Kashima, Kanagawa-ken, JP;

Shoko Suzuki, Kanagawa-ken, JP;

Akira Tajima, Tokoyo-to, JP;

Rikiya Takahashi, Kanagawa-ken, JP;

Toshihiro Takahashi, Kanagawa-ken, JP;

Yuta Tsuboi, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 3/02 (2006.01); G01S 5/02 (2010.01);
U.S. Cl.
CPC ...
Abstract

Location estimation systems, methods, and non-transitory computer program products. The system includes: storage means provided in the computer, means for storing the vector datasets in the storage means of the computer, means for calculating the similarity between the vector dataset without any location label and each neighboring vector dataset with a location label, by using any one of a q-norm where 0≦q≦1 and an exponential attenuation function, and means for estimating the location label of the vector data without any location label from the calculated similarities.


Find Patent Forward Citations

Hido, Shohei. (2013). Location estimation system, method and program (U.S. Patent No. 8405551). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8405551

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