The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Mar. 25, 2008
Applicants:
Tomy Varghese, Madison, WI (US);
Hao Chen, Madison, WI (US);
Inventors:
Tomy Varghese, Madison, WI (US);
Hao Chen, Madison, WI (US);
Assignee:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An elastographic imaging system providing for axial, lateral and elevational strain measurements employs a series of one-dimensional axial measurements to deduce a coarse axial, lateral and/or elevational displacement that is used to guide one or more, two- or three-dimensional cross-correlations of smaller kernels providing improved image resolution.