The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2013

Filed:

Nov. 11, 2010
Applicants:

Hao Xiang Lin, Taoyuan, TW;

Yan Zuo Chen, Taoyuan, TW;

Wen Feng Cheng, Taoyuan, TW;

Jui Hsiang Chang, Taoyuan, TW;

Inventors:

Hao Xiang Lin, Taoyuan, TW;

Yan Zuo Chen, Taoyuan, TW;

Wen Feng Cheng, Taoyuan, TW;

Jui Hsiang Chang, Taoyuan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An edge-type backlight module and a direct-type backlight module with a optical device are provided. The optical device comprises an array layer and a second refractive layer. The array layer has a first refractive index (n) and contains pluralities of lenticular lens disposed on a base surface side by side. The lenticular lens contains a curving structure with a peak, a trough, a curvature radius (R), a width (P) and an altitude (H) between the peak and the trough. The trough is disposed on the base1 surface. The array layer has a first critical angle (θ) relative to the normal of the base surface and satisfies and The conical constant (K) of the lenticular lens ranges from −2.1 to −1.5. The second refractive layer is adjacent to the array layer and has a second refractive index (n) and a second critical angle (θ) relative to the normal line of the second refractive layer. The first refractive index (n) is greater than the second refractive index (n) and is satisfied. Wherein the lenticular lens, the first critical angle (θ) and the second critical angle (θ) satisfy the equation of


Find Patent Forward Citations

Loading…