The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Jul. 17, 2007
Geetika Agrawal, San Jose, CA (US);
Jacques Joseph Labrie, Sunnyvale, CA (US);
Mary Ann Roth, San Jose, CA (US);
Yannick Saillet, Stuttgart, DE;
Geetika Agrawal, San Jose, CA (US);
Jacques Joseph Labrie, Sunnyvale, CA (US);
Mary Ann Roth, San Jose, CA (US);
Yannick Saillet, Stuttgart, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Provided are a method, system, and article of manufacture for managing validation models and rules to apply to data sets. A schema definition describing a structure of at least one column in a first data set having a plurality of columns and records providing data for each of the columns is received. At least one model is generated, wherein each model asserts conditions for at least one column in a record of the first data set. The schema definition and the at least one model are stored in a data quality model. Selection is received of a second data set and the data quality model. A determination is made as to whether a structure of the second data set is compatible with the schema definition in the selected data quality model. Each model in the data quality model is applied to the records in the second data set to validate the records in the second data set in response to determining that the structure of the second data set and the schema definition are compatible.