The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Feb. 19, 2009
Applicants:

Dave Havener, Olathe, KS (US);

Timothy Gibson, Overland Park, KS (US);

Manuel Franklin Richey, Paola, KS (US);

Jyotsna Motukupally, Olathe, KS (US);

Inventors:

Dave Havener, Olathe, KS (US);

Timothy Gibson, Overland Park, KS (US);

Manuel Franklin Richey, Paola, KS (US);

Jyotsna Motukupally, Olathe, KS (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/16 (2006.01); H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are methods and systems for mitigating unwanted signal components. A received carrier signal is downconverted using a local reference signal that imposes an frequency perturbation or dither. Later, when an intermediate digitized signal is filtered to remove the DC offset that is an artifact of the sampling process, the dither in the carrier signal serves to distinguish the carrier from the unwanted offset. The preferred offset filter is a low pass filter with a passband that is narrow relative to the frequency range of the dither.


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