The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Dec. 03, 2007
Applicants:

Ayu Miyakawa, Kawasaki, JP;

Masayoshi Shimizu, Kawasaki, JP;

Yasuhiko Nakano, Kawasaki, JP;

Yuri Watanabe, Kawasaki, JP;

Inventors:

Ayu Miyakawa, Kawasaki, JP;

Masayoshi Shimizu, Kawasaki, JP;

Yasuhiko Nakano, Kawasaki, JP;

Yuri Watanabe, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

When different images are combined, the corresponding parts are to be aligned accurately. To thus combine images, the feature point of each pixel is calculated from each original image using an operator (filter). The pixels are divided into blocks that the resolution matches that of the reduced image of each original image, and an expectation value map for registering the expectation value of the feature point of each block is drawn. Feature points are expected from the expectation values which the expectation value map holds, and reduced images are superposed one on the other. The feature points of the original images corresponding to the feature points between which the correspondence is derived from the reduced images are extracted, and the original images are superposed one on the other using the extracted feature points.


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