The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Mar. 14, 2008
Method to provide automated quality feedback to imaging devices to achieve standardized imaging data
Applicants:
John Hargrove, Honolulu, HI (US);
Jia Gu, Honolulu, HI (US);
Wenjing LI, Honolulu, HI (US);
Rolf Holger Wolters, Kailua, HI (US);
Inventors:
John Hargrove, Honolulu, HI (US);
Jia Gu, Honolulu, HI (US);
Wenjing Li, Honolulu, HI (US);
Rolf Holger Wolters, Kailua, HI (US);
Assignee:
STI Medical Systems, LLC, La Jolla, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/03 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
Abstract
Automated image quality assessment algorithms, which perform the functions of locating a region of interest, maximizing the image contrast, and ensuring the region of interest is properly centered in the image. Wherein the region of interest is located by spectral matching filter using a target spectrum obtained from samples of the image itself.