The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Jan. 22, 2010
Applicants:
Leiming Su, Tokyo, JP;
Yukio Hoshino, Kanagawa, JP;
Yukio Itakura, Kanagawa, JP;
Inventors:
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A region of an iris image where eyelash and other part images are mixed is identified with accuracy. The noise region of an iris image contained in a digital eye image (P) where, for example, eyelash and eyelid parts are mixed is identified with accuracy based on characteristic curves obtained by scanning the iris image with arcs (AR) and (AR). Then, authentication is performed using data created based on the iris image from which the noise region is excluded. In this way, the subject can be authenticated with accuracy without being affected by noise.