The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Dec. 29, 2008
Makoto Ueda, Kanagawa, JP;
Hironori Kumanomido, Kanagawa, JP;
Ishi Mitsuhashi, Kanagawa, JP;
Tsukasa Kikuchi, Tokyo, JP;
Kenichi Yoshioka, Kanagawa, JP;
Tomoharu Sasaki, Kanagawa, JP;
Kouji Hiraiwa, Kanagawa, JP;
Makoto Ueda, Kanagawa, JP;
Hironori Kumanomido, Kanagawa, JP;
Ishi Mitsuhashi, Kanagawa, JP;
Tsukasa Kikuchi, Tokyo, JP;
Kenichi Yoshioka, Kanagawa, JP;
Tomoharu Sasaki, Kanagawa, JP;
Kouji Hiraiwa, Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A first intensity Aexpressed as A=a×E, a first reference intensity Aexpressed as A=a×E, a second intensity Bexpressed as B=b×E, and a second reference intensity B=b×E, are evaluated. The first intensity and the first reference intensity are of radioactive nuclides generated by a neutron capture reaction of a heavy nuclide or a fission product nuclide. The second intensity and the second reference intensity are of radioactive fission product nuclides except nuclides generated by a neutron capture reaction. The reference intensities are measured where the void fraction is known. Also a correlation curve of (a/a) and a void fraction is evaluated. Finally an axial void fraction distribution is evaluated based on the value of (a/a) and the correlation curve.