The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Nov. 29, 2006
Applicants:

Susumu Terakawa, Hamamatsu, JP;

Takashi Sakurai, Hamamatsu, JP;

Hisao Osawa, Kashiwa, JP;

Yasujiro Kiyota, Tokyo, JP;

Inventors:

Susumu Terakawa, Hamamatsu, JP;

Takashi Sakurai, Hamamatsu, JP;

Hisao Osawa, Kashiwa, JP;

Yasujiro Kiyota, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The observing apparatus is being equipped with an image-forming optical system which forms an image of light emitted from a specimen, an imaging unit which picks up the image of the specimen formed by the image-forming optical system, and an illuminating unit which illuminates the specimen with a surface illuminant in which bright areas and dark areas are arranged alternately in order to provide an observing apparatus suitable to observe a transparent specimen with a wide field of view. If the position of the surface illuminant and the pitch of contrasting are set properly, each partial area of the specimen is illuminated obliquely at a small angle by each bright area of the surface illuminant. Therefore, the imaging unit can acquire a dark-field observation image of each partial area.


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