The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Nov. 11, 2008
Applicant:

Yuichi Tomioka, Utsunomiya, JP;

Inventor:

Yuichi Tomioka, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning device includes a light source device, a deflector, an input optical system for directing a light beam from the light source device onto the deflector, and an imaging optical system for imaging a light beam scanningly deflected by a deflecting surface of the deflector, upon a scan surface to be scanned, wherein, in a sub-scan section, a light beam directed from the input optical system toward the deflecting surface of the deflector is incident thereon at a finite angle with respect to a plane which is orthogonal to a rotational axis of the deflector, wherein the imaging optical system includes at least one molded imaging lens, and wherein a shape within a sagittal section of at least one lens surface, of lens surfaces of the at least one imaging lens, is non-arcuate, and a sagittal curvature in a light beam passage region has an extreme value.


Find Patent Forward Citations

Loading…