The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Mar. 18, 2010
Koki Uwatoko, Ashigarakami-gun, JP;
Koki Uwatoko, Ashigarakami-gun, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image defect diagnostic system includes: an acquiring unit acquiring image data for a test target image; an image defect detecting unit detecting image defects in the test target image; a coordinate conversion processor performing coordinate conversion processing to convert position coordinate information on the image defects into position coordinate information in each rotated coordinate system by every predetermined angle by using a coordinate point in the test target image as rotation center coordinates; an occurrence state detecting unit detecting an occurrence state of the image defects in each rotated coordinate system by using the position coordinate information; a setting unit setting a coordinate rotation angle for the coordinate conversion processing on the basis of the occurrence state; and a feature amount extracting unit extracting a feature amount characterizing the image defects, by using the position coordinate information in a coordinate system rotated by the coordinate rotation angle.