The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Jul. 15, 2011
Denis Lépine, Québec, CA;
Denis Lépine, Québec, CA;
Centre de Recherche Industrielle du Quebec, Quebec, CA;
Abstract
An enclosure for an optical inspection apparatus for scanning the profile of at least one surface of an article moving along a travel path axis, which apparatus having a frame for mounting a profile sensor unit using a laser source, includes a peripheral portion connected to the frame and forming spaced apart peripheral edges defining a space in which the frame and the profile sensor unit are contained, and front end and rear end portions each having an opening aligned with the travel path axis to allow the movement of the article through the apparatus. At least one of the front and rear end portions is provided with a pair of access doors having outer closing edges adapted to mate with corresponding portions of the peripheral edges, and inner closing edges adapted to mate one with another at first portions thereof, wherein at least one of the inner closing edges is provided with a clearance at a second portion thereof to define one of the openings whenever the access doors are brought one toward another to a closing position. The second portion is provided with at least one shielding element adjacent to the clearance to confine reflections of the laser beam within the enclosure while allowing the movement of the article.