The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Dec. 17, 2009
Applicants:

Jonathan Nagel, Brooklyn, NY (US);

Sheryl Woodward, Holmdel, NJ (US);

Inventors:

Jonathan Nagel, Brooklyn, NY (US);

Sheryl Woodward, Holmdel, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are systems and methods for enhancing sensitivity of an optical time-domain reflectometer ('OTDR') using bi-directional analysis techniques. One embodiment of the disclosure of this application is related to a computer readable storage medium including a set of instructions that are executable by a processor. The set of instructions being operable to collect a first set of measurement data at a first resolution to provide a relative backscatter of the fiber, collect a second set of measurement data taken at a second resolution to calculate loss along the length of fiber, and combine the first set of measurement data with the second set of measurement data to calculate the loss along the fiber at the first resolution.


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