The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
May. 31, 2011
Mark E. Froggatt, Blacksburg, VA (US);
Justin W. Klein, Blacksburg, VA (US);
Dawn K. Gifford, Blacksburg, VA (US);
Matthew Reaves, Christiansburg, VA (US);
Joseph J. Bos, Christiansburg, VA (US);
Alexander K. Sang, Christiansburg, VA (US);
Mark E. Froggatt, Blacksburg, VA (US);
Justin W. Klein, Blacksburg, VA (US);
Dawn K. Gifford, Blacksburg, VA (US);
Matthew Reaves, Christiansburg, VA (US);
Joseph J. Bos, Christiansburg, VA (US);
Alexander K. Sang, Christiansburg, VA (US);
Luna Innovations Incorporated, Roanoke, VA (US);
Abstract
An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.