The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Sep. 08, 2010
Applicants:

William Ross Rapoport, Bridgewater, NJ (US);

Kwong Wing AU, Bloomington, MN (US);

James Kane, Lawrenceville, NJ (US);

Carsten Lau, Niedersachsen, DE;

Inventors:

William Ross Rapoport, Bridgewater, NJ (US);

Kwong Wing Au, Bloomington, MN (US);

James Kane, Lawrenceville, NJ (US);

Carsten Lau, Niedersachsen, DE;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A value document authentication apparatus and system that includes value document substrates having a uniform distribution of one or more phosphors that emit infrared radiation in one or more wavelengths, which can be measured at the same location on the value document that is illuminated by a phosphor exciting light source when the document passes the light source with a uniform velocity. The illumination and measurement locations on the value document can be offset. The measured infrared radiation as a series of overlapped measurements along a pre-selected track in the value document represents an intensity profile, which can be normalized after removing high variations. The normalized intensity profile of a test value document can be compared with normalized intensity profile from valid reference documents to authenticate the test value document.


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