The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
May. 19, 2009
Ichiro Oyama, Osaka, JP;
Norihiro Imamura, Osaka, JP;
Ichiro Oyama, Osaka, JP;
Norihiro Imamura, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A calibration device and method calibrates a distance measuring device which provides captured images with significant lens aberration. The calibration device and method estimate a camera parameter representing a characteristic of each imaging system of a distance measuring device, and perform the following: capture, using the distance measuring device, an image of a reference chart which (i) represents a geometric pattern in which elements are arranged and (ii) is positioned to have a predetermined positional relationship with the distance measuring device; modify a luminance distribution affected by aberration of the lens in the captured image of the reference chart; calculate, as a feature point position, a gravity center position of each element in the captured image whose luminance distribution is modified; and estimate the camera parameter using the feature point position calculated in the calculating and an approximate actual gravity center position in the reference chart.