The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8400472 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 19, 2013

Filed:

Feb. 25, 2009
Applicants:

Ofir Weber, RaAnana, IL;

Mirela Ben-chen, Binyamina, IL;

Craig(chaim) Gotsman, Haifa, IL;

Inventors:

Ofir Weber, RaAnana, IL;

Mirela Ben-Chen, Binyamina, IL;

Craig(Chaim) Gotsman, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/37 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of deforming a geometric object. The method comprises providing a data segment representing a geometric object, defining a contour enclosing the geometric object in the data segment, calculating a plurality of barycentric coordinates having a plurality of complex coefficients according to the enclosing contour, receiving user input to manipulate the enclosing contour to a target contour, and using the plurality of barycentric coordinates according to the target contour for mapping the geometric object to a target geometric object.


Find Patent Forward Citations

Weber, Ofir. (2013). Method and system of geometric deformation (U.S. Patent No. 8400472). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8400472

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…