The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Jun. 29, 2010
Applicants:

Po-yang Chen, Miao-Li County, TW;

Po-sheng Shih, Miao-Li County, TW;

Chih-han Chao, Miao-Li County, TW;

Chien-yung Cheng, Miao-Li County, TW;

Inventors:

Po-Yang Chen, Miao-Li County, TW;

Po-Sheng Shih, Miao-Li County, TW;

Chih-Han Chao, Miao-Li County, TW;

Chien-Yung Cheng, Miao-Li County, TW;

Assignee:

Chimei Innolux Corporation, Miao-Li County, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-touch detecting method is adapted for detecting locations of touched points on a touch panel including first and second conductive films, and includes following steps. First measuring points of the first conductive film distributed along X-axis of a Cartesian plane are scanned, and x-components are determined accordingly. Second measuring points of the second conductive film distributed along Y-axis of the Cartesian plane are scanned, and y-components are determined accordingly. A first voltage is applied to the first conductive film, and A second voltage is applied to at least one of the second measuring points with the location on the Y-axis adjacent to or overlapping one of the y-components. Voltages at the first measuring points with the locations on the X-axis adjacent to or overlapping the x-components are measured sequentially and one of the y-components and one of the x-components are outputted.


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