The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8400366 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 19, 2013

Filed:

Oct. 27, 2009
Applicant:

Hiroshi Kitada, Kanagawa-ken, JP;

Inventor:

Hiroshi Kitada, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A target antennaA to be measured and a measuring antennaare placed within an anechoic chamber. A first azimuth angle plane radiation pattern S(R,θ,φ) is measured using a network analyzerwith an elevation angle φ of the target antennaA fixed to a first angle φ. Next, a second azimuth angle plane radiation pattern S(R,θ,φ) is measured using the network analyzerwith the elevation angle φ of the target antennaA fixed to a second angle φdifferent from the first angle φby 90 degrees. A radiation efficiency of the target antennaA is measured by integrating in a spherical shape the azimuth angle plane radiation patterns S(R,θ,φ) at two planes.


Find Patent Forward Citations

Kitada, Hiroshi. (2013). Radiation efficiency measuring apparatus and radiation efficiency measuring method (U.S. Patent No. 8400366). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8400366

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…