The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Dec. 31, 2009
Marvin L. Vestal, Framingham, MA (US);
Marvin L. Vestal, Framingham, MA (US);
Virgin Instruments Corporation, Sudbury, MA (US);
Abstract
A tandem time-of-flight mass spectrometer includes a first pulsed ion source that produces ions with a first mass and charge that directs the ions into a first stage of a tandem TOF mass spectrometer. In addition, a second pulsed ion source produces ions with a second mass and an opposite charge directs the ions into the first stage of the tandem TOF mass spectrometer. A field-free reaction region is positioned in the ion flight path so that ions from first and second pulsed ion source arrive at the entrance of the field-free reaction region substantially simultaneously in at least one of time and space. At least some of the ions from the first and second pulsed ion source are fragmented by ion-ion collision between positive and negative ions. A second stage of the tandem mass spectrometer separates fragment ions produced in the reaction region according to their mass-to-charge ratio.