The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Jun. 27, 2008
Applicants:
Mazbahul Kabir, Seattle, WA (US);
Syamal Raychaudhuri, Seattle, WA (US);
James William Needham, Seattle, WA (US);
Stanislaw Morkowski, Seattle, WA (US);
Inventors:
Mazbahul Kabir, Seattle, WA (US);
Syamal Raychaudhuri, Seattle, WA (US);
James William Needham, Seattle, WA (US);
Stanislaw Morkowski, Seattle, WA (US);
Assignee:
Inbios International, Inc., Seattle, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/558 (2006.01); G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract
A lateral flow test system together with methods for its use in the detection of one or more analytes, or components, of interest within a sample, such as a biological sample, is provided. The system comprises a liquid formulation of a gold conjugate and a lateral flow assay device that does not include a conjugate pad having conjugate dried thereon.