The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Apr. 28, 2010
Applicants:
Atsushi Fukunaga, Osaka, JP;
Takahiro Nakaminami, Osaka, JP;
Akihito Kamei, Kyoto, JP;
Inventors:
Assignee:
Panasonic Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
The measuring device of the invention includes: a first container and a second container for holding a sample; and an optical measurement part for carrying out an optical measurement. The first container has a first sample supply inlet for supplying a sample containing an analyte to the first container and at least one electrode. The second container has a second sample supply inlet for supplying the sample to the second container and a reagent holding part for holding a reagent for the optical measurement.