The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2013
Filed:
Aug. 29, 2008
Applicants:
Gerd P. Pfeifer, Duarte, CA (US);
Tibor A. Rauch, Chicago, IL (US);
Zunde Wang, San Gabriel, CA (US);
Xiwei Wu, Duarte, CA (US);
Inventors:
Gerd P. Pfeifer, Duarte, CA (US);
Tibor A. Rauch, Chicago, IL (US);
Zunde Wang, San Gabriel, CA (US);
Xiwei Wu, Duarte, CA (US);
Assignee:
City of Hope, Duarte, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to the identification of novel DNA biomarkers and the use of the aberrant methylation patterns of the biomarkers to diagnose a disease or a condition (e.g., a cancer) associated therewith. In particular, the present invention relates to the use of the novel DNA biomarkers to diagnose lung cancers, e.g., squamous cell carcinomas and adenocarcinomas.