The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Apr. 01, 2008
Applicants:

Peter Hildebrand, Pfronten, DE;

Gottfried Reinicke, Kempten, DE;

Inventors:

Peter Hildebrand, Pfronten, DE;

Gottfried Reinicke, Kempten, DE;

Assignee:

Sauer GmbH Lasertec, Kempten, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for workpiece levelling includes mounting the workpiece in a machine tool, measuring the position of the workpiece in the mounting and determining a translatory offset xv, yv, zv and a rotatory offset λv, βv, φv of the factual workpiece mounting compared to the ideal mounting from the measurement results and from a workpiece data forming an initial data set related to the ideal mounting, wherein for obtaining another initial data set a plurality of surface points of the mounted workpiece are measured in their position xn, yn, zn in space, the data of one of the initial data sets are varied a plurality of times in accordance with plural translatory and rotatory displacements for obtaining a plurality of varied data sets, from the varied data sets and their base data set the one data set is determined that represents a surface with a lowest deviation measure compared to a surface represented by the other of the initial data sets, and the translatory offset xv, yv, zv and the rotatory offset λv, βv, φv is determined from the translatory and rotatory displacement of the determined data set.


Find Patent Forward Citations

Loading…