The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Sep. 22, 2010
Jason G. Mchugh, Seattle, WA (US);
Eric Yves Theriault, Seattle, WA (US);
Seth W. Markle, Seattle, WA (US);
Michael A. Uhlar, Sammamish, WA (US);
Alyssa H. Henry, Seattle, WA (US);
Jason G. McHugh, Seattle, WA (US);
Eric Yves Theriault, Seattle, WA (US);
Seth W. Markle, Seattle, WA (US);
Michael A. Uhlar, Sammamish, WA (US);
Alyssa H. Henry, Seattle, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Embodiments may include a consistency measurement component that utilizes memory-efficient sets (e.g., Bloom filters) to generate consistency metrics for read operations performed on different replicated data objects of distributed storage system. Based on the consistency metrics, the consistency measurement component may identify a subset of replicated data objects associated with low levels of consistency. The consistency measurement component may target this subset for consistency improvement by generating instructions to improve the consistency of the subset. In other cases, the consistency measurement component may notify a consistency improvement component about the targeted subset. In response, the consistency improvement component may generate instructions to improve the consistency of the targeted subset.