The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
May. 16, 2011
Dae-yong Sim, Suwon-si, KR;
Ho-seok Lee, Anyang-si, KR;
Dae-yong Sim, Suwon-si, KR;
Ho-seok Lee, Anyang-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of measuring a state of a plurality of channels is provided. The method includes transmitting to a second device test signal information needed to transmit/receive a test signal for measuring the state of the plurality of channels; receiving an information received response from the second device, indicating that the second device has received the test signal; if the information received response is received, transmitting the test signal to the second device, using the test signal information, via the plurality of channels; and receiving from the second device the state information regarding the plurality of channels which has been measured by using the test signal.