The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Jan. 21, 2011
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An X-ray imaging method includes performing an X-ray exposure via an X-ray radiation source responsive to a source controller. The method also includes sampling X-ray image data via a digital detector without communication of timing signals from the source controller. The method further includes combining the sampled X-ray image data of at least one imaging frame or two or more imaging frames with at least one of the frames spanning a duration in which the exposure occurred, to produce X-ray image data capable of being reconstructed into a user-viewable image.