The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Jul. 29, 2010
Jeremy A. Thurn, Bloomington, MN (US);
Ibro Tabakovic, Edina, MN (US);
Maissarath Nassirou, Fremont, CA (US);
Brian Karr, Savage, MN (US);
Kurt W. Wierman, Eden Prairie, MN (US);
Joachim W. Ahner, Livermore, CA (US);
Jeremy A. Thurn, Bloomington, MN (US);
Ibro Tabakovic, Edina, MN (US);
Maissarath Nassirou, Fremont, CA (US);
Brian Karr, Savage, MN (US);
Kurt W. Wierman, Eden Prairie, MN (US);
Joachim W. Ahner, Livermore, CA (US);
Seagate Technology LLC, Cupertino, CA (US);
Abstract
A contact pad includes a first layer of material with a first yield strength and a second layer of material with a second yield strength is laminated to the first layer. A third yield strength of the laminated composite of the first layer and the second layer exceeds the first yield strength and the second yield strength due to the Hall-Petch phenomenon. An overcoat covers an edge of the first layer and the second layer of the contact pad to prevent wear. A method of creating the contact pad or other microelectronic structure includes depositing a first layer of material with a first yield strength on a substrate. A second layer of material with a second yield strength is deposited on the first layer. An edge of the first layer and the second layer is coated with an overcoat material to prevent wear of the first and second layers.