The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

Jan. 27, 2012
Applicants:

Massimo Balducci, Imola, IT;

Sanzio Caroli, Imola, IT;

Inventors:

Massimo Balducci, Imola, IT;

Sanzio Caroli, Imola, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an Apparatus for inspection of concave elements, for detection of contaminations and/or defects, comprising means for lighting a concave element to be subjected to inspection, an image detection unit, such as a camera or like, an optic group and means for processing images acquired by said image detection unit, in order to individuate said contaminations and/or said defects of said concave element, characterized in that said lighting means comprise a first light source, suitable to generate a diffused lighting direct on the concave surface, and a second light source, suitable to generate a grazing lighting directed on the outer lateral surface of said concave element, and in that said optic group is placed so as to detect light emitted by concave surface and transmitting the same to said image detection unit.


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