The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

Dec. 24, 2009
Applicants:

Masaaki Hirano, Yokohama, JP;

Toshiki Taru, Yokohama, JP;

Inventors:

Masaaki Hirano, Yokohama, JP;

Toshiki Taru, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Highly accurate measurement of chromatic dispersions of a device under test that is an optical component is enabled with a simple structure comprising: propagating pump light having a wavelength λand probe light having a wavelength λprobe through the device; calculating the generation efficiency of the idler light with respect to the wavelength λby measuring the power of idler light having a wavelength λoutput from the device according to four-wave mixing generated in the device; seeking the frequency difference or wavelength difference between the pump light and the probe light that makes an extremum of generation efficiency of the idler light; calculating phase mismatch among the pump light wavelength having such frequency difference or wavelength difference, the probe light wavelength, and the idler light wavelength; and on the basis of such calculation results, calculating the chromatic dispersion of the device at the wavelength λ.


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