The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Nov. 25, 2008
Colman Shannon, Lawrenceville, NJ (US);
Cormic K. Merle, Rochester, NY (US);
Michael H. Brill, Kingston, NJ (US);
Brian Levey, Yardley, PA (US);
Colman Shannon, Lawrenceville, NJ (US);
Cormic K. Merle, Rochester, NY (US);
Michael H. Brill, Kingston, NJ (US);
Brian Levey, Yardley, PA (US);
Datacolor Holding AG, Lucerne, CH;
Abstract
One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring initial spectral sensitivities of at least four channels of the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to CIE color matching functions, measuring CIE tristimulus values of test colors on the display using a reference color measurement device, measuring the CIE tristimulus values on the display using the test color measurement device, transforming the CIE tristimulus values measured by the test color measurement device to CIE tristimulus values that would have been measured by the reference color measurement device, using a nonlinear function with variable fitting coefficients, and storing initial fitting coefficient values that provide a least-square best fit of the CIE tristimulus values measured by the test color measurement device and the CIE tristimulus values measured by the reference color measurement device.