The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Jun. 02, 2009
Minot Clements, Charlottesville, VA (US);
Bradley Kingston, Manhattan Beach, CA (US);
David Kuo, Redondo Beach, CA (US);
David Penn, Chantilly, VA (US);
Lawrence K. Warman, Lothian, MD (US);
Minot Clements, Charlottesville, VA (US);
Bradley Kingston, Manhattan Beach, CA (US);
David Kuo, Redondo Beach, CA (US);
David Penn, Chantilly, VA (US);
Lawrence K. Warman, Lothian, MD (US);
Raytheon Applied Signal Technology, Inc., Sunnyvale, CA (US);
Abstract
An inspection system and method for determining the elemental makeup of contents of an article includes a localizer for identifying at least one region of interest of the article from data representative of contents of the article, the at least one region of interest having a cross-sectional area or a volume that is less than the entire cross-sectional area or the entire volume of the article, an associated particle imaging device that produces an output that is indicative of the elemental makeup of contents of the article, a data selector for selecting a portion of the output of the associated particle imaging device that corresponds to respective identified regions of interest, and an analyzer for analyzing the portions of the output of the associated particle imaging device selected by the data selector to determine the elemental makeup of contents of the article in each identified region of interest.